Thiemann, Fabian; Sciaini, G.; Kassen, A.; Lott, T. S.; Horn-von Hoegen, Michael:
Disentangling the electronic and lattice contributions to the dielectric response of photoexcited bismuth
In: Physical Review B, Vol. 109 (2024), No. 4, Article L041105
2024article/chapter in journalOA Green
Physics (incl. Astronomy)Faculty of Physics
Related: 1 publication(s)
Title in English:
Disentangling the electronic and lattice contributions to the dielectric response of photoexcited bismuth
Author:
Thiemann, FabianUDE
LSF ID
62299
ORCID
0000-0002-2903-2933ORCID iD
Other
connected with university
corresponding author
;
Sciaini, G.
ORCID
0000-0002-2120-3996ORCID iD
;
Kassen, A.;Lott, T. S.
ORCID
0000-0001-7156-1268ORCID iD
;
Horn-von Hoegen, MichaelUDE
GND
1201039908
LSF ID
10366
ORCID
0000-0003-0324-3457ORCID iD
Other
connected with university
Year of publication:
2024
Open Access?:
OA Green
arXiv.org ID
Scopus ID
Language of text:
English
Type of resource:
Text

Abstract in English:

Elucidating the interplay between nuclear and electronic degrees of freedom that govern the complex dielectric behavior of materials under intense photoexcitation is essential for tailoring optical properties on demand. However, conventional transient reflectivity experiments have been unable to differentiate between real and imaginary components of the dielectric response, omitting crucial electron-lattice interactions. Utilizing thin film interference we unambiguously determine the photoinduced change in the complex dielectric function in the Peierls semimetal bismuth and examine its dependence on the excitation density and nuclear motion of the A1g phonon. Our modeled transient reflectivity data reveal a progressive broadening and redshift of Lorentz oscillators with increasing excitation density and underscores the importance of both electronic and nuclear coordinates in the renormalization of interband transitions.