Zhang, Kai; Shardt, Yuri A. W.; Chen, Zhiwen; Ding, Steven X.; Peng, Kaixiang:
A brief survey of different statistics for detecting multiplicative faults in multivariate statistical process monitoring
In: 2016 IEEE 55th Conference on Decision and Control (CDC) - IEEE Conference on Decision and Control, December 12-14, 2016, Las Vegas, USA - Piscataway: IEEE, 2016, pp. 2152 - 2157
2016book article/chapter in Proceedings
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Title in English:
A brief survey of different statistics for detecting multiplicative faults in multivariate statistical process monitoring
Author:
Zhang, KaiUDE
LSF ID
54704
ORCID
0000-0002-3708-8945ORCID iD
Other
connected with university
;Shardt, Yuri A. W.
;Chen, ZhiwenUDE
LSF ID
53691
ORCID
0000-0002-4759-0904ORCID iD
Other
connected with university
;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
;Peng, Kaixiang
DOI
10.1109/CDC.2016.7798582
IEEE ID
7798582
Scopus ID
85010818391
Language of text:
English
Appears in
2016 IEEE 55th Conference on Decision and Control (CDC)
Conference
IEEE Conference on Decision and Control, December 12-14, 2016, Las Vegas, USA
Place of publication:
Piscataway
Publisher:
IEEE
Year of publication:
2016
in:
pp. 2152 - 2157
ISBN
978-1-5090-1837-6
Type of resource:
Text