Jiang, Qingchao; Ding, Steven X.; Wang, Yang; Yan, Xuefeng:
Data-Driven Distributed Local Fault Detection for Large-Scale Processes Based on the GA-Regularized Canonical Correlation Analysis
In: IEEE Transactions on Industrial Electronics (T-IE), Vol. 64 (2017), No. 10, pp. 8148 - 8157
2017article/chapter in journal
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Related: 1 publication(s)
Title in English:
Data-Driven Distributed Local Fault Detection for Large-Scale Processes Based on the GA-Regularized Canonical Correlation Analysis
Author:
Jiang, Qingchao
;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
corresponding author
;Wang, Yang
;Yan, Xuefeng
Other
corresponding author
Year of publication:
2017
DOI
10.1109/TIE.2017.2698422
IEEE ID
7913603
Scopus ID
85030111392
Language of text:
English
Appears in
IEEE Transactions on Industrial Electronics (T-IE)
Title in English (abbreviated):
IEEE Trans Ind Electron
Place of publication:
Piscataway
Publisher:
IEEE
in:
Vol. 64 (2017), No. 10, pp. 8148 - 8157
ISSN
1557-9948 Show availability online & print
ISSN
0278-0046 Show availability online & print
ISSN
0018-9421 Show availability online & print
ZDB ID
2027527-4
Library shelfmark:
88 Z 16
Keyword, Topic:
Canonical correlation analysis (CCA) ; distributed fault detection ; genetic algorithm (GA) ; large-scale processes
Type of resource:
Text