Anti-Blooming Clocking for Time-Delay Integration CCDs
In: Sensors, Vol. 22 (2022), No. 19, Article 7520
2022article/chapter in journalOA Gold
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Elektronische Bauelemente und Schaltungen
Related: 1 publication(s)
Title in English:
Anti-Blooming Clocking for Time-Delay Integration CCDs
Author:
Piechaczek, Denis Szymon
- ORCID
-
0000-0001-5796-8512
- Other
- corresponding author
- LSF ID
- 13457
- ORCID
-
0000-0001-8172-0568
- Other
- connected with university
- LSF ID
- 1309
- Other
- connected with university
- GND
- 173084451
- LSF ID
- 50200
- ORCID
-
0000-0003-3416-3310
- Other
- connected with university
Year of publication:
2022
Open Access?:
OA Gold
Web of Science ID
PubMed ID
Scopus ID
Note:
CA Piechaczek
Language of text:
English
Appears in
Place of publication:
Basel
Publisher:
MDPI
in:
Vol. 22 (2022), No. 19, Article 7520
ISSN
ZDB ID
Keyword, Topic:
blooming ; charge-coupled device ; conversion gain ; photon transfer curve ; responsivity ; signal-to-noise ratio ; time delay integration
Abstract in English:
This paper presents an investigation of the responsivity of a time-delay integration (TDI) charge-coupled device that employs anti-blooming clocking and uses a varying number of TDI stages. The influence of charge blooming caused by unused TDI stages in a TDI deployed selection scheme is shown experimentally, and an anti-blooming clocking mechanism is analyzed. The impact of blooming on sensor characteristics, such as the responsivity, the conversion gain, and the signal-to-noise ratio, is investigated. A comparison of the measurements with and without this anti-blooming clocking mechanism is presented and discussed in detail.