Thien, Dagmar; Kury, Peter; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; van Heys, J.; Lindenblatt, M.; Pehlke, E.:
Domain Sensitive Contrast in Photoelectron Emission Microscopy
In: Physical Review Letters, Vol. 99 (2007), No. 19, p. 196102
2007article/chapter in journal
Physics (incl. Astronomy)Faculty of Physics » Experimental PhysicsScientific institutes » Center for Nanointegration Duisburg-Essen (CENIDE)
Related: 1 publication(s)
Title in English:
Domain Sensitive Contrast in Photoelectron Emission Microscopy
Author:
Thien, DagmarUDE
LSF ID
10445
Other
connected with university
;Kury, Peter;Horn-von Hoegen, MichaelUDE
GND
1201039908
LSF ID
10366
ORCID
0000-0003-0324-3457ORCID iD
Other
connected with university
;Meyer zu Heringdorf, FrankUDE
LSF ID
48700
ORCID
0000-0002-5878-2012ORCID iD
Other
connected with university
;van Heys, J.;Lindenblatt, M.;Pehlke, E.
Year of publication:
2007
DOI
10.1103/PhysRevLett.99.196102
Language of text:
English
Appears in
Physical Review Letters
Place of publication:
College Park
Publisher:
American Physical Society (APS)
in:
Vol. 99 (2007), No. 19, p. 196102
ISSN
1079-7114 Show availability online & print
ISSN
0031-9007 Show availability online & print
ZDB ID
1472655-5
Library shelfmark:
67 P 8