Gao, Long; Li, Donghui; Chen, Zhiwen; Ding, Steven X.; Luo, Hao:
SIR-Aided Dynamic Canonical Correlation Analysis for Fault Detection and Isolation of Industrial Automation Systems
In: IEEE Transactions on Industrial Electronics (T-IE) (2023), in press
2023article/chapter in journalClosed access
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Related: 1 publication(s)
Title in English:
SIR-Aided Dynamic Canonical Correlation Analysis for Fault Detection and Isolation of Industrial Automation Systems
Author:
Gao, Long
;Li, Donghui
;Chen, ZhiwenUDE
LSF ID
53691
ORCID
0000-0002-4759-0904ORCID iD
Other
connected with university
corresponding author
;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
;Luo, Hao
Year of publication:
2023
Open Access?:
Closed access
DOI
10.1109/TIE.2023.3337553
Web of Science ID
001127407100001
Scopus ID
85179820206
Note:
in press
Language of text:
English
Appears in
IEEE Transactions on Industrial Electronics (T-IE)
Title in English (abbreviated):
IEEE Trans Ind Electron
Place of publication:
Piscataway
Publisher:
IEEE
in:
in press
ISSN
1557-9948 Show availability online & print
ISSN
0278-0046 Show availability online & print
ISSN
0018-9421 Show availability online & print
ZDB ID
2027527-4
Library shelfmark:
88 Z 16
Keyword, Topic:
Automation ; Canonical correlation analysis (CCA) ; closed-loop dynamic ; Correlation ; Fault detection ; fault detection ; Feedback control ; Generators ; optimal fault isolation ; residual generation ; Steady-state ; Transient analysis
Type of resource:
Text