Characterization of deformation phenomena in polymers by rapid-scanning Fourier transform infrared (FTIR) spectroscopy and mechanical measurements : I. The stress-induced crystalline phase transition in poly(butylene terephthalate)
In: Journal of Polymer Science : Polymer Letters Edition, Vol. 17 (1979), No. 7, pp. 453 - 458
1979article/chapter in journal
Chemistry
Title in English:
Characterization of deformation phenomena in polymers by rapid-scanning Fourier transform infrared (FTIR) spectroscopy and mechanical measurements : I. The stress-induced crystalline phase transition in poly(butylene terephthalate)
Author:
Siesler, Heinz WilhelmUDE
- LSF ID
- 11044
- ORCID
-
0000-0002-6791-9965
- Other
- connected with university
Year of publication:
1979
Language of text:
English