Modifications of the electronic structure of Ni/Cu(001) as a function of the film thickness

Srivastava, P.; Haack, N.; Wende, Heiko; Chauvistre, R.; Baberschke, K.:

In: Physical Review B : Condensed matter and materials physics, Vol. 56 (1997), No. 8, pp. R4398 - R4401

1997article/chapter in journal

Physics (incl. Astronomy)

Title in English:

Modifications of the electronic structure of Ni/Cu(001) as a function of the film thickness

Author:

Srivastava, P.;Haack, N.;Wende, Heiko^UDE;Chauvistre, R.;Baberschke, K.

Year of publication:

1997

DOI

Language of text:

English

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Place of publication:

College Park

Publisher:

American Physical Society (APS)

in:

Vol. 56 (1997), No. 8, pp. R4398 - R4401

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Note:

1.1970 - 92.2015

Succeeding:

University bibliography