Nzodoum Fotsing, J.L.; Dietzel, D.; Chotikaprakhan, S.; Meckenstock, Ralf; Pelzl, J.; Cassette, S.:
Evalluation fo active semiconductor structures by combined scanning thermo-elastic microscopy and fiite element simulations.
In: J. Phys. IV France, Band 125 (2005), S. 117
2005Artikel/Aufsatz in ZeitschriftPhysik
Titel:
Evalluation fo active semiconductor structures by combined scanning thermo-elastic microscopy and fiite element simulations.
Autor(in):
Nzodoum Fotsing, J.L.; Dietzel, D.; Chotikaprakhan, S.; Meckenstock, RalfLSF; Pelzl, J.; Cassette, S.
Erscheinungsjahr
2005