Nzodoum Fotsing, J.L.; Dietzel, D.; Chotikaprakhan, S.; Meckenstock, Ralf; Pelzl, J.; Cassette, S.:
Evalluation fo active semiconductor structures by combined scanning thermo-elastic microscopy and fiite element simulations.
In: J. Phys. IV France, Vol. 125 (2005), p. 117
2005article/chapter in journal
Physics (incl. Astronomy)
Title:
Evalluation fo active semiconductor structures by combined scanning thermo-elastic microscopy and fiite element simulations.
Author:
Nzodoum Fotsing, J.L.;Dietzel, D.;Chotikaprakhan, S.;Meckenstock, RalfUDE
LSF ID
46939
ORCID
0009-0002-6537-0646ORCID iD
Other
connected with university
;Pelzl, J.;Cassette, S.
Year of publication:
2005
Appears in
J. Phys. IV France
in:
Vol. 125 (2005), p. 117
Library shelfmark:
67 A 21