Davies, Patrick Laurie; Gather, U.; Meise, Monika; Mergel, Dieter; Mildenberger, T.:
Residual Based Localisation and Quantification of Peaks in X-Ray Diffractograms.
In: Annals of Applied Statistics, 2 (2008), pp. 861 - 886
2008article/chapter in journal
Mathematics
Title:
Residual Based Localisation and Quantification of Peaks in X-Ray Diffractograms.
Author:
Davies, Patrick LaurieUDE
LSF ID
5085
Other
connected with university
;Gather, U.;Meise, MonikaUDE
LSF ID
5187
Other
connected with university
;Mergel, DieterUDE
LSF ID
10490
Other
connected with university
;Mildenberger, T.
Year of publication:
2008
Appears in
Annals of Applied Statistics, 2
in:
pp. 861 - 886