Single-shot electron bunch length measurements using a spatial electro-optical autocorrelation interferometer
In: Review of Scientific Instruments, Vol. 81 (2010), No. 10, p. 104702
2010article/chapter in journal
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » General and Theoretical Electrical Engineering
Related: 1 publication(s)
Title in English:
Single-shot electron bunch length measurements using a spatial electro-optical autocorrelation interferometer
Author:
Sütterlin, Daniel;Erni, DanielUDE
- GND
- 1175897205
- LSF ID
- 47126
- ORCID
-
0000-0002-1467-6373
- Other
- connected with university
Year of publication:
2010
Scopus ID
Language of text:
English
Appears in
Title in English (abbreviated):
Rev. Sci. Instrum.
Title in English (abbreviated):
Rev. of Sci. Instrum.
Place of publication:
Melville
Publisher:
American Institute of Physics (AIP)
in:
Vol. 81 (2010), No. 10, p. 104702
ISSN
ISSN
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