Sütterlin, Daniel; Erni, Daniel; Schlott, Volker; Sigg, Hans; Jäckel, Heinz; Murk, Axel:
Single-shot electron bunch length measurements using a spatial electro-optical autocorrelation interferometer
In: Review of Scientific Instruments, Vol. 81 (2010), No. 10, p. 104702
2010article/chapter in journal
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » General and Theoretical Electrical Engineering
Related: 1 publication(s)
Title in English:
Single-shot electron bunch length measurements using a spatial electro-optical autocorrelation interferometer
Author:
Sütterlin, Daniel;Erni, DanielUDE
GND
1175897205
LSF ID
47126
ORCID
0000-0002-1467-6373ORCID iD
Other
connected with university
;Schlott, Volker;Sigg, Hans;Jäckel, Heinz;Murk, Axel
Year of publication:
2010
DOI
10.1063/1.3480997
Scopus ID
78149437206
Language of text:
English
Appears in
Review of Scientific Instruments
Title in English (abbreviated):
Rev. Sci. Instrum.
Title in English (abbreviated):
Rev. of Sci. Instrum.
Place of publication:
Melville
Publisher:
American Institute of Physics (AIP)
in:
Vol. 81 (2010), No. 10, p. 104702
ISSN
1089-7623 Show availability online & print
ISSN
0034-6748 Show availability online & print
ZDB ID
1472905-2
Library shelfmark:
67 Z 219
DESTATIS Subject Classification:
7110 Allgemeine Elektrotechnik