Meyer zu Heringdorf, Frank; Pietsch, H.; Horn-von Hoegen, Michael:
Reciprocal Space Mapping by spot profile analyzing low energy electron diffraction
In: Review of Scientific Instruments, Vol. 76 (2005), No. 8, p. 85102
2005article/chapter in journal
Physics (incl. Astronomy)Faculty of Physics » Experimental Physics
Related: 1 publication(s)
Title:
Reciprocal Space Mapping by spot profile analyzing low energy electron diffraction
Author:
Meyer zu Heringdorf, FrankUDE
LSF ID
48700
ORCID
0000-0002-5878-2012ORCID iD
Other
connected with university
;
Pietsch, H.;Horn-von Hoegen, MichaelUDE
GND
1201039908
LSF ID
10366
ORCID
0000-0003-0324-3457ORCID iD
Other
connected with university
Year of publication:
2005

Abstract:

We present an experimental approach for the recording of two-dimensional reciprocal space maps using spot profile analyzing low energy electron diffraction (SPA-LEED). A specialized alignment procedure eliminates the shifting of LEED patterns on the screen which is commonly observed upon variation of the electron energy. After the alignment, a set of one-dimensional sections through the diffraction pattern is recorded at different energies. A freely available software tool is used to assemble the sections into a reciprocal space map. The necessary modifications of the Burr-Brown computer interface of the two Leybold and Omicron type SPA-LEED instruments are discussed and step-by-step instructions are given to adapt the SPA 4.1d software to the changed hardware. Au induced faceting of 4° vicinal Si(001) is used as an example to demonstrate the technique.