Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast x-ray diffraction
In: Journal de Physique . IV France, Vol. 11 (2001), No. PR2, pp. 473 - 477
2001article/chapter in journal
Physics (incl. Astronomy)Faculty of Physics » Experimental Physics
Title:
Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast x-ray diffraction
Author:
Sokolowski-Tinten, KlausUDE
- GND
- 172725364
- LSF ID
- 13459
- ORCID
- 0000-0002-7979-5357
- Other
- connected with university
- GND
- 1201039908
- LSF ID
- 10366
- ORCID
- 0000-0003-0324-3457
- Other
- connected with university
- GND
- 121993092X
- LSF ID
- 10402
- ORCID
- 0000-0001-5618-3879
- Other
- connected with university
- LSF ID
- 50189
- Other
- connected with university
Year of publication:
2001
Abstract:
Using time-resolved x-ray diffraction ultafast lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures has been studied. This experimental technique uniquely allows us to observe fast energy transport deep into the bulk of the material, coherent acoustic phonon dynamics, lattice anharmonicity, and vibrational transport across a buried interface.