Diesing, Detlef; Kovacs, Domocos; Stella, Kevin; Heuser, Christian:
Characterization of atom and ion-induced "internal" electron emission by thin film tunnel junctions
In: Nuclear instruments & methods in physics research / Section B, Beam interactions with materials and atoms, Vol. 269 (2011), No. 11, pp. 1185 - 1189
2011article/chapter in journal
ChemistryFaculty of Chemistry » Physikalische Chemie
Title:
Characterization of atom and ion-induced "internal" electron emission by thin film tunnel junctions
Author:
Diesing, DetlefUDE
LSF ID
11102
ORCID
0000-0002-5587-2557ORCID iD
Other
connected with university
;Kovacs, Domocos;Stella, Kevin;Heuser, ChristianUDE
LSF ID
47555
Other
connected with university
Year of publication:
2011
DOI
10.1016/j.nimb.2010.12.034
Appears in
Nuclear instruments & methods in physics research / Section B, Beam interactions with materials and atoms
in:
Vol. 269 (2011), No. 11, pp. 1185 - 1189
Library shelfmark:
67 Z 78