Chavez, Ruben; Angst, Sebastian; Maize, Kerry D.; Gondorf, Andreas; Schierning, Gabi; Wolf, Dietrich E.; Lorke, Axel; Shakouri, Ali H.:
Thermoreflectance Imaging of Percolation Effects and Dynamic Resistance in Indium Tin Oxide Nanoparticle Layers
In: Journal of Applied Physics, Vol. 112 (2012), No. 8, Article 083705
2012article/chapter in journal
Electrical Engineering and Information TechnologyPhysics (incl. Astronomy)Faculty of Physics » Experimental PhysicsFaculty of Engineering » Engineering and Information Technology » Technology for NanostructuresScientific institutes » Center for Nanointegration Duisburg-Essen (CENIDE)
Related: 1 publication(s)
Title in English:
Thermoreflectance Imaging of Percolation Effects and Dynamic Resistance in Indium Tin Oxide Nanoparticle Layers
Author:
Chavez, Ruben
;Angst, SebastianUDE
LSF ID
52237
Other
connected with university
;Maize, Kerry D.
;Gondorf, AndreasUDE
LSF ID
17878
Other
connected with university
;Schierning, GabiUDE
GND
130135615
LSF ID
63162
ORCID
0000-0003-2591-2463ORCID iD
Other
connected with university
;Wolf, Dietrich E.UDE
GND
1273280393
LSF ID
1114
Other
connected with university
;Lorke, AxelUDE
GND
1042619697
LSF ID
2509
ORCID
0000-0002-0405-7720ORCID iD
Other
connected with university
;Shakouri, Ali H.
Year of publication:
2012
DOI
10.1063/1.4757960
Scopus ID
84868360480
Language of text:
English
Appears in
Journal of Applied Physics
Title in English (abbreviated):
J Appl Phys
Place of publication:
College Park
Publisher:
American Institute of Physics (AIP)
in:
Vol. 112 (2012), No. 8, Article 083705
ISSN
0021-8979 Show availability online & print
ISSN
1089-7550 Show availability online & print
ZDB ID
1476463-5
Library shelfmark:
67 J 14
Type of resource:
Text