Pan, R.; Jeffries, Jay B.; Dreier, Thomas; Schulz, Christof:
Measurements of liquid film thickness and solute concentration of aqueous NaCl solution by absorption spectroscopy
In: Optics InfoBase Conference Papers - Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2014; Seattle, United States; 13 - 17 July 2014 - Washington: Optical Society of America (OSA), 2014, p. JTu4A.46
2014book article/chapter in Proceedings
Mechanical EngineeringFaculty of Engineering » Maschinenbau und Verfahrenstechnik » Institute for Energy and Materials Processes (EMPI)Faculty of Engineering » Maschinenbau und Verfahrenstechnik » Institute for Energy and Materials Processes (EMPI) » Reactive Fluids
Title in English:
Measurements of liquid film thickness and solute concentration of aqueous NaCl solution by absorption spectroscopy
Author:
Pan, R.UDE
LSF ID
48452
Other
connected with university
;Jeffries, Jay B.
;Dreier, ThomasUDE
LSF ID
47223
ORCID
0000-0001-8313-4992ORCID iD
Other
connected with university
;Schulz, ChristofUDE
GND
1148037985
LSF ID
48807
ORCID
0000-0002-6879-4826ORCID iD
Other
connected with university
DOI
10.1364/aio.2014.jtu4a.46
Scopus ID
85084779650
Language of text:
English
Appears in
Optics InfoBase Conference Papers
Conference
Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2014; Seattle, United States; 13 - 17 July 2014
Place of publication:
Washington
Publisher:
Optical Society of America (OSA)
Year of publication:
2014
in:
p. JTu4A.46
ISBN
978-1-55752-308-2