Chen, Zhiwen; Liang, Ketian; Ding, Steven X.; Yang, Chao; Peng, Tao; Yuan, Xiaofeng:
A Comparative Study of Deep Neural Network-Aided Canonical Correlation Analysis-Based Process Monitoring and Fault Detection Methods
In: IEEE Transactions on Neural Networks and Learning Systems, Vol. 33 (2022), No. 11, pp. 6158 - 6172
2022article/chapter in journalClosed access
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Related: 1 publication(s)
Title in English:
A Comparative Study of Deep Neural Network-Aided Canonical Correlation Analysis-Based Process Monitoring and Fault Detection Methods
Author:
Chen, ZhiwenUDE
LSF ID
53691
ORCID
0000-0002-4759-0904ORCID iD
Other
connected with university
corresponding author
;Liang, Ketian
;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
;Yang, Chao
ORCID
0000-0001-7648-6738ORCID iD
;Peng, Tao
ORCID
0000-0002-7662-0471ORCID iD
;Yuan, Xiaofeng
ORCID
0000-0002-9072-7179ORCID iD
Year of publication:
2022
Open Access?:
Closed access
DOI
10.1109/TNNLS.2021.3072491
IEEE ID
9411717
Web of Science ID
000732233300001
PubMed ID
33886482
Scopus ID
85104671522
Language of text:
English
Appears in
IEEE Transactions on Neural Networks and Learning Systems
Title in English (abbreviated):
IEEE Trans Neural Networks Learn Sys
Place of publication:
New York
Publisher:
IEEE
in:
Vol. 33 (2022), No. 11, pp. 6158 - 6172
ISSN
2162-237X Show availability online & print
ISSN
2162-2388 Show availability online & print
ZDB ID
2644189-5
Library shelfmark:
88 Z 181
Note:
ab Jg. 23, 2012
Type of resource:
Text
Keyword, Topic:
Canonical correlation analysis (CCA) ; Computational modeling ; Correlation ; deep neural network (DNN) ; dynamic process monitoring ; fault detection ; Fault detection ; Nonlinear dynamical systems ; nonlinear process monitoring ; Process monitoring ; State-space methods ; Task analysis
DESTATIS Subject Classification:
7100 Elektrotechnik allgemein