Lattice degradation by moving voids during reversible electromigration
In: Journal of Applied Physics, Jg. 116 (2014), Heft 3, S. 034502
2014Artikel/Aufsatz in Zeitschrift
Physik (inkl. Astronomie)Fakultät für Physik » ExperimentalphysikForschungszentren » Center for Nanointegration Duisburg-Essen (CENIDE)
Damit verbunden: 1 Publikation(en)
Titel:
Lattice degradation by moving voids during reversible electromigration
Autor*in:
Sindermann, SimonUDE
- LSF ID
- 51046
- Sonstiges
- der Hochschule zugeordnete*r Autor*in
- LSF ID
- 53288
- Sonstiges
- der Hochschule zugeordnete*r Autor*in
- LSF ID
- 53518
- ORCID
- 0000-0002-8461-5832
- Sonstiges
- der Hochschule zugeordnete*r Autor*in
- LSF ID
- 53271
- Sonstiges
- der Hochschule zugeordnete*r Autor*in
- GND
- 1273280393
- LSF ID
- 1114
- Sonstiges
- der Hochschule zugeordnete*r Autor*in
- LSF ID
- 1107
- Sonstiges
- der Hochschule zugeordnete*r Autor*in
- LSF ID
- 48700
- ORCID
- 0000-0002-5878-2012
- Sonstiges
- der Hochschule zugeordnete*r Autor*in
Erscheinungsjahr:
2014
Abstract:
Electromigration driven void motion is studied in Ag wires with an initially well-defined single crystal lattice by in situ scanning electron microscopy. Voids are moving in opposite direction to the electron flow. When the electron current is reversed, voids exactly retrace their previous motion path with an increased drift velocity: The microstructure of the Ag wire “remembers” the motion path of the initial voids. To investigate the nature of this memory effect, we analyzed the crystal lattice with electron backscatter diffraction after passing of a void. The results show a permanent lattice degradation caused by the moving void. The implication of this finding for the reversibility of EM will be discussed.