Klein, Julian; Kampermann, Laura; Mockenhaupt, Benjamin; Behrens, Malte; Strunk, Jennifer; Bacher, Gerd:
Limitations of the Tauc Plot Method
In: Advanced Functional Materials, Jg. 33 (2023), Heft 47, Artikel 2304523
2023Artikel/Aufsatz in ZeitschriftOA Hybrid
ElektrotechnikFakultät für Ingenieurwissenschaften » Elektrotechnik und Informationstechnik » Werkstoffe der ElektrotechnikForschungszentren » Center for Nanointegration Duisburg-Essen (CENIDE)
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Titel in Englisch:
Limitations of the Tauc Plot Method
Autor*in:
Klein, JulianUDE
LSF ID
60961
ORCID
0000-0003-2349-6953ORCID iD
Sonstiges
der Hochschule zugeordnete*r Autor*in
;
Kampermann, LauraUDE
LSF ID
60247
ORCID
0000-0002-8204-2460ORCID iD
Sonstiges
der Hochschule zugeordnete*r Autor*in
;
Mockenhaupt, Benjamin
;
Behrens, MalteUDE
GND
1042780021
LSF ID
56419
ORCID
0000-0003-3407-5011ORCID iD
Sonstiges
der Hochschule zugeordnete*r Autor*in
;
Strunk, JenniferUDE
GND
13425810X
LSF ID
57337
Sonstiges
der Hochschule zugeordnete*r Autor*in
;
Bacher, GerdUDE
GND
110666038
LSF ID
3929
ORCID
0000-0001-8419-2158ORCID iD
Sonstiges
der Hochschule zugeordnete*r Autor*in
korrespondierende*r Autor*in
Erscheinungsjahr:
2023
Open Access?:
OA Hybrid
Web of Science ID
Scopus ID
Sprache des Textes:
Englisch
Schlagwort, Thema:
bandgap ; metal oxide ; semiconductor ; Tauc plot ; UV–vis spectroscopy
Ressourcentyp:
Text

Abstract in Englisch:

The Tauc plot is a method originally developed to derive the optical gap of amorphous semiconductors such as amorphous germanium or silicon. By measuring the absorption coefficient α(hν) and plotting (Formula presented.) versus photon energy hν, a value for the optical gap (Tauc gap) is determined. In this way non-direct optical transitions between approximately parabolic bands can be examined. In the last decades, a modification of this method for (poly-) crystalline semiconductors has become popular to study direct and indirect interband transitions. For this purpose, (ahν)ⁿ (n = (Formula presented.), 2) is plotted against hν to determine a value of the electronic bandgap. Due to the ease of performing UV–vis measurements, this method has nowadays become a standard to analyze various (poly-) crystalline solids, regardless of their different electronic structure. Although this leads partially to widely varying values of the respective bandgap of nominally identical materials, there is still no study that critically questions which peculiarities in the electronic structure prevent a use of the Tauc plot for (poly-) crystalline solids and to which material classes this applies. This study aims to close this gap by discussing the Tauc plot and its limiting factors for exemplary (poly-) crystalline solids with different electronic structures.