Abstract in English:

Optical spectroscopy is commonly used to study the properties of 2D materials. In order to obtain the best signal-to-noise ratio, it is important to optimize the incoupling of the excitation laser and, at the same time, reduce spurious light reflection. We performed Raman spectroscopy on exfoliated hexagonal boron nitride (hBN) flakes of different thicknesses, placed on a 300 nm SiO₂ on Si substrate. By changing the hBN layer thickness, we found a specific thickness, where the Raman signals from the substrate and the hBN showed maximum intensity, whereas the backscattered laser light was suppressed. To explain the increased emission, we calculated the reflectivity and transmissivity of the full layer system (air, hBN, SiO₂, and Si) as a function of hBN layer thicknesses for different excitation wavelengths (457, 532, and 633 nm), using the transfer-matrix algorithm. To compare theory with the experiment, we performed Raman measurements with these three different excitation wavelengths on different flakes and determined their thicknesses with AFM measurements. The experimental results are in good agreement with the calculations, which shows the importance of thin film interference to obtain optimum spectroscopic conditions. Since interference colors are easily visible in an optical microscope, this facilitates the choice of optimum flakes for a wide range of optical characterization techniques, including Raman, photoluminescence, and single defect spectroscopy.