Siesler, Heinz W.; Yan, Hui; De Gea Neves, Marina:
On-Site Quality Control and Protection against Product Counterfeiting by Handheld Near-Infrared Spectroscopy : Anywhere and Anytime
In: Next-Generation Spectroscopic Technologies ; 1-3 May 2023, Orlando, Florida, USA: Next-Generation Spectroscopic Technologies XV : 1-3 May 2023, Orlando, Florida, United States / Crocombe, Richard A.; Profeta, Luisa T. M. (Hrsg.). - Next-Generation Spectroscopic Technologies ; 1-3 May 2023, Orlando, Florida, USA - Bellingham: SPIE, 2023 - (Proceedings of SPIE ; 12516), Artikel 1251606